JUNE 16-21, 2013 • TAMPA, FLORIDA
105
G21
(155)
Inductively Coupled Plasma Atomic
Emission Spectroscopy: A bulk analysis
technique for monitoring silicon solar cell
fabrication
Amruta P Joshi
1
,
Mehul C Raval
1
,
Anil
Kottantharayil
2
,
Chetan S Solanki
1
1
Department of Energy Science & Engineering,
Indian Institute of Technology Bombay, Mumbai,
India,
2
Department of Electrical Engineering,
Indian Institute of Technology Bomay, Mumbai,
India
G25
(156)
A Study of O2 Concentration Profile in CZ
Process for Single Crystal Silicon Ingot
YuJin Jung, Jae Hak Jung
Yeungnam University, Gyeongsan, South Korea
G29
(157)
Studying light-induced degradation by
lifetime decay analysis
Tine U Nærland, Halvard Haug, Rune Søndenå
Institute for Energy Technology, Kjeller, Norway
G33
(158)
Analysis of the meniscus in the
horizontal ribbon growth process
German A Oliveros
1
,
James Church
1
,
Seetharaman Sridhar
2
,
B. Erik Ydstie
1
1
Department of Chemical Engineering,
Carnegie Mellon University, Pittsburgh, PA,
USA,
2
Department of Materials Science and
Engineering, Carnegie Mellon University,
Pittsburgh, PA, USA
G37
(159)
Silicon Grain Crystallographic
Orientation Measurement from NIR
Transmission and Reflection
Kevin Skenes, Guru Prasath, Steven Danyluk
George W. Woodruff School of Mechanical
Engineering, Georgia Institute of Technology,
Atlanta, GA, USA
G41
(160)
A Comparison of Wafers Sawn by Resin
Bonded and Electroplated Diamond Wire –
From Wafer to Cell
Pin-Hsueh Tsai, Yen-Chun Chou, Shang-Wei
Yang, Yu-Chung Chen, Chih-Hsyong Wu
Motech Industries, Inc., Tainan, Taiwan
H1
(161)
Gettering of Iron in Silicon Solar Cells
with Implanted Emitters
Ville Vähänissi, Antti Haarahiltunen, Marko Yli-
Koski, Hele Savin
Aalto University, Espoo, Finland
TECHNICAL PROGRAM
