Page 114 - PVSC 39 Yellow Book

112
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
K35
(201)
Intercomparison Measurement of
Crystalline Silicon PV Modules in Test
Laboratories of China
Haitao Liu
1
,
Dean Wen
2
,
Wen Zhao
3
,
Xun Wang
4
,
Wenjuan Jiang
5
1
Institute of Electrical Engineering, Chinese
Academy of Sciences, Beijing, China,
2
VDE Global
Services GMBH, Shanghai, China,
3
Yangzhou
Opto-Electrical Products Testing Institute,
Yangzhou, China,
4
National Solar PV Product
Quality Supervision and Inspection Center,
Wuxi, China,
5
Canadian Solar Manufacturing
(
Changshu) Inc, Changshu, China
K37
(202)
Estimation of Subcell Photocurrent in
IMM3J using LED Bias Light
Tetsuya Nakamura
1
,
Mitsuru Imaizumi
1
,
Shin-ichiro
Sato
2
,
Takeshi Ohshima
2
1
Japan Aerospace Exploration Agency (JAXA),
Tsukuba, Japan,
2
Japan Atomic Energy Agency
(
JAEA), Takasaki, Japan
K39
(203)
Effect of solar irradiance and temperature
on impedance properties of PV modules
Jean-François Penneau, Florent Auricane
EDF R&D, Moret sur Loing, France
K41
(204)
Potential for LED Solar Simulators
Foteini Plyta, Thomas, R. Betts, Ralph Gottschalg
Centre for Renewable Energy Systems
Technology (CREST), School of Electronic,
Electrical and Systems Engineering,
Loughborough University, Loughborough, UK
K43
(205)
Spectral Mismatch Effect to the Open-
circuit Voltage in the Indoor Characterization
of Multi-junction Thin-film Photovoltaic
Modules
Mauro Pravettoni
1
,
Alessandro Virtuani
1
,
Kerstin
Keller
2
,
Marco Apolloni
2
,
Harald Müllejans
3
1
University of Applied Sciences and Arts of
Southern Switzerland, Canobbio, Switzerland,
2
TEL Solar AG, Trubbach, Switzerland,
3
European
Commission, DG Joint Research Centre, Ispra,
Italy
L1
(206)
Implementation of a Levenberg-
Marquardt Algorithm to Perform Regression to
I-V Curves
Andrew R. Risinger
The Johns Hopkins University Applied Physics
Laboratory, Laurel, MD, USA
L3
(207)
A study of the artifact external quantum
efficiency on Ge-bottom subcell in triple-
junction solar cell
Mitsunobu Sugai
1
,
Jiro Harada
1
,
Mitsuru
Imaizumi
2
,
Shinichiro Sato
3
,
Takeshi Ohshima
3
1
Advanced Engineering Services Co., Ltd.,
Tsukuba, Japan,
2
Japan Aerospace Exploration
Agency, Tsukuba, Japan,
3
Japan Atomic Energy
Agency, Takasaki, Japan
TECHNICAL PROGRAM