122
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
Area 8 - Orals
1:30 - 3:00
PM
MR 23
Characterization of Silicon Cells and Material (II)
Chair: Yoshihiro Hishikawa, Radovan Kopecek
1:30
(262)
Extension of PV Optics to Include Front
Metallization
Bhushan Sopori
1
,
NM Ravindra
2
,
Rene Rivero
1,2
,
Debraj Guhabiswas
1,2
1
National Renewable Energy Laboratory, Golden,
CO, USA,
2
New Jersey Institute of Technology,
Newark, NJ, USA
1:45
(263)
Griddler: Intelligent Computer Aided Design
of Complex Solar Cell Metallization Patterns
Johnson Wong
Solar Energy Research Institute of Singapore,
Singapore, Singapore
2:00
(264)
Online Monitoring for Si Solar Cell
Manufacturing
Bhushan Sopori
1
,
Srinivas Devayajanam
1,2
,
Rene
Rivero
1,2
,
Peter Rupnowski
3
1
National Renewable Energy Laboratory, Golden,
CO, USA,
2
New Jersey Institute of Technology,
Newark, NJ, USA,
3
Dow Corning Inc., Midland,
MI, USA
2:15
(265)
Characterizing Damage on Si Wafer
Surfaces Cut by Slurry and Diamond Wire
Sawing
Bhushan Sopori
1
,
Srinivas Devayajanam
1,2
,
Sudhakar Shet
1,2
,
Debraj Guhabiswas
1,2
,
Lynn
Gedvilas
1
,
Kim Jones
1
,
Jeff Binns
3
,
Jesse Appel
4
,
Prakash Basnyat
1,2
1
National Renewable Energy Laboratory, Golden,
CO, USA,
2
New Jersey Institute of Technology,
Newark, NJ, USA,
3
MEMC Electronic Materials,
Portland, OR, USA,
4
MEMC Electronic Materials,
St. Peters, MO, USA
2:30
(266)
Single Contact Electron Beam
Induced Current Technique for Solar Cell
Characterization
Lei Meng
1,2
,
Alan G. Street
3
,
Jacob C.H. Phang
1,3
,
Charanjit S. Bhatia
1,2
1
Centre for Integrated Circuit Failure Analysis and
Reliability (CICFAR), Department of Electrical
and Computer Engineering, National University of
Singapore, Singapore, Singapore,
2
Solar Energy
Research Institute of Singapore (SERIS), National
University of Singapore, Singapore, Singapore,
3
Inscope Labs Pte. Ltd., Singapore, Singapore
2:45
Best Student Presentation Award
Finalist
(267)
Using Impedance Spectroscopy for
Enhanced Capacitance-Voltage Measurements
on Solar Cells with Multiple Space Charge
Regions and a Structured Surface
Kay-Michael Guenther
1
,
Thomas Gimpel
2
,
Wolfgang Schade
1,2
,
Stefan Kontermann
2
1
Clausthal University of Technology, EFZN,
Goslar, Germany,
2
Fraunhofer Heinrich Hertz
Institute, Goslar, Germany
TECHNICAL PROGRAM
