JUNE 16-21, 2013 • TAMPA, FLORIDA
149
N35
(432)
Comparison of Different DC Arc Spectra -
Derivation of Proposals for the Development of
an International Arc Fault Detector Standard
S Raubach, F Reil, M Vosen, E Dietrich
TÜV Rheinland Energie und Umwelt GmbH,
Cologne, Germany
N37
(433)
Global Quantification of UV Irradiation as
Stress Factor for PV-Modules
Karolina Slamova, Christian Schill, Jochen Wirth,
Michael Koehl
Fraunhofer ISE, Freiburg, Germany
N39
(434)
UV Aging Performance of Blue Light
Encapsulant Films
Rebecca L Smith
1
,
Katherine M Stika
2
,
Dennis J
Walls
2
,
Yefim Brun
2
1
E.I. DuPont de Nemours & Co, Washington, WV,
USA,
2
E.I. DuPont de Nemours & Co, Wilmington,
DE, USA
N41
(435)
Potential Induced Degradation of Pre-
Stressed Photovoltaic Modules: Effect of
Glass Surface Conductivity Disruption
Sai Tatapudi, Faraz Ebneali, Joseph Kuitche,
GovindaSamy TamizhMani
Arizona State University Photovoltaic Reliability
Lab, Mesa, AZ, USA
N43
(436)
Reliability and Energy Output of Bifacial
Modules
Bas B. Van Aken, Mark J. Jansen, Nico J.J.
Dekker
ECN - Solar Energy, Petten, Netherlands
N44
(437)
Point Admittance Spectroscopy: New PV
Diagnostic
Anthony C Vasko, Victor G Karpov
The University of Toledo, Toledo, OH, USA
O1
(438)
Arc Fault and Flash Detection in PV DC
Arrays Using Wavelets
Zhan Wang, Robert S Balog
Texas A&M University, College Station, TX, USA
O2
(439)
Investigating A-Si Device Degradation
Using Environmental Doses
Jiang Zhu, Martin Bliss, Thomas R Betts, Ralph
Gottschalg
Loughborough University, Loughborough,
Leicestershire, UK
Special Activity
4:00 - 6:00
PM
East Hall
PV JOBS FAIR
Social Activity
6:00 - 8:00
PM
Jacksons
Cherry Award Reception
TECHNICAL PROGRAM
