JUNE 16-21, 2013 • TAMPA, FLORIDA
47
PM TUTORIALS
SUNDAY, JUNE 16TH, 1:30 PM – 5:00 PM
PM1. AN END-TO-END (DEVICE-MODULE-SYSTEM)
PERSPECTIVE PV RELIABILITY
(
MR 11-12)
Instructors:
Muhammad (Ashraf) Alam, Purdue University
and Mike Fife, Advanced Energy, Inc.
Synopsis:
This tutorial will provide attendees with a basic
working knowledge of photovoltaic (PV) system reliability.
Topics will cover four main sections: physics of PV cell
reliability and degradation, cell-to-module efficiency loss,
balance-of-system (including inverter) reliability, and
system reliability estimation. Topics covered in the PC cell
reliability section include the distinction between intrinsic
and. extrinsic reliability, theory and practice of active
layer degradation and the statistics and universality of
shunt formation. The cell-to-module efficiency loss will be
discussed in the context of series connectivity, scribing,
and shadow degradation. The problem of polymer
charging and degradation will also be discussed. A similar
overview of balance-of-system reliability will be given with
a focus on the inverter, which is known to be responsible
for the bulk of PV system downtime. We will then show
how to bring individual component reliability estimates
into a single plant-wide system reliability model. Some of
the metrics discussed will be mean time between failures
(
MTBF), annualized failure rate, and availability. We will
conclude with a discussion on how reliability metrics tie
back to plant economics via number of truck rolls, service
cost, and lost energy production.
PM2. SILICON SOLAR CELL TECHNOLOGY
(
MR 13)
Instructor:
Dr. Ron Sinton, Sinton Instruments
Synopsis:
This tutorial will look at various aspects of
crystalline silicon technologies, from the silicon bricks and
ingots through sawing, solar cell production, cell test, and
module test. The interactions between the various stages
from feedstock to the module testing will be discussed. An
emphasis will be placed on device physics as well as test
and measurement strategies that are used to optimize the
cell and module design and provide real-time feedback for
process control at each stage of production.
TUTORIAL PROGRAM