JUNE 16-21, 2013 • TAMPA, FLORIDA
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TECHNICAL PROGRAM
PROGRAM CHAIR GREETING
On behalf of the Technical Program Committee, I am
honored to welcome you to the 39th IEEE PVSC. The
PVSC endeavors to cover all aspects of photovoltaics
technology, including the latest in device performance,
new module encapsulation technologies, novel
characterization techniques, knowledge gained from field
experiences, or new PV material science. The chance to
share and discuss these important PV developments in a
timely and influential forum is what the PVSC is all about.
For PVSC39, we have expanded the number of technical
areas to eleven (11), adding a new cross-technology area
focused on Reliability of PV, headed up by Dr. Sarah Kurtz
of NREL (Area 10). As the PV industry has grown, it has
become increasingly critical to have confidence in the
long-term performance of the GWs of PV, representing
enormous financial investment. This topic cuts across all
PV technologies and throughout the supply chain.
Despite the shake-ups and challenges the PV market is
experiencing, worldwide research efforts continue to be
robust. PVSC39 received more than 1000 submissions,
a near record number. From these submissions, as well
as invited presentations, an excellent technical program
of over 600 posters and 290 oral presentations has been
assembled. The technical program consists of up to seven
(7)
parallel tracks and the Program Committee has strived
to minimize conflicts between technical areas with shared
audiences. To help alleviate conflict, many joint sessions
have been assembled, so please look at the conference
schedule carefully.
A significant number of PVSC submissions (approximately
120)
were offered the opportunity to publish their PVSC
manuscripts in the peer-reviewed IEEE Journal of
Photovoltaics (J-PV). This valuable opportunity permits
researchers to present their best original research results
at the PVSC, while having that work made available to
a global audience through a high impact, peer-reviewed
journal. If your work wasn’t offered this opportunity, you
are certainly welcome to add new results to your PVSC
paper (30% min) and submit it for consideration by J-PV.
And for next year, consider adding all of your high impact
data to your review abstract to improve your chances of
being offered the opportunity to publish your PVSC paper
in J-PV.
As we’ve done for the past few years, all PVSC papers
will be made available to attendees electronically on the
Monday following the conference. In addition, we will be
uploading the majority of the PVSC papers to IEEE Xplore
within a few months of the conference. Once all of the
PVSC/J-PV papers complete the peer-review process,
TECHNICAL PROGRAM
