60
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
TECHNICAL AREA OVERVIEWS
AREA 8 OVERVIEW
CHARACTERIZATION METHODS
Chair
Gerald Siefer, Fraunhofer ISE,
Germany
Co-Chairs
Tonio Buonassisi, M.I.T, USA
Yoshihiro Hishikawa, AIST, Japan
Yanfa Yan, The University of
Toledo, USA
Sub-Areas & Chairs
8.1:
Defects in Photovoltaic
Materials and Solar Cells
8.2:
Advanced Methods and Instruments for the
Characterization of Solar Cells and Modules
8.3:
In-Situ Measurements, Process Control, Defect
Monitoring.
8.4:
Challenges in the Characterization of Novel Solar
Cell Devices
8.5:
Performance Testing and Standards
It is impossible to understand innovation in science without
the support of measurements and characterization.
Measurements are needed at all different levels of
R&D and production - from the investigation of the
operating principles of solar cells to the development of
standards for the performance of installed PV systems.
Understanding the relations between structure, physical
properties, and the resulting PV performance is an
exemplary problem in materials science and engineering.
Reliable and precise determination of the efficiency and
thus power of solar cells and PV modules is crucial for
the successful widespread deployment of photovoltaics.
Area 8 is intended for the presentation of the latest
developments in the characterization of photovoltaics. We
encourage members of the PV community to submit their
contributions addressing the full range of scientific and
technological challenges in the field of characterization.
