Page 84 - PVSC 39 Yellow Book

82
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
Area 8 - Orals
1:30 - 3:00
PM
MR 23
Device Related Characterization
Chair: Maxim Shvarts, Carsten Baur
1:30
Best Student Presentation Award Finalist
(32)
Energy Yield of Thin-Film PV Modules and
the Relevance of Low Irradiance, Spectral and
Temperature Effects
Markus Schweiger
1
,
Ulrike Jahn
1
,
Werner
Herrmann
1
,
Uwe Rau
2
1
TÜV Rheinland AG, Cologne, Germany,
2
Forschungszentrum Jülich GmbH, Jülich,
Germany
1:45
(33)
Device-Dependent Light-Level Correction
Errors in Photovoltaic I-V Performance
Measurements
Mark Campanelli, Keith Emery
National Renewable Energy Laboratory, Golden,
CO, USA
2:00
(34)
Fast and Reliable Spectral Response
Measurements of PV Cells Using Light
Emitting Diodes
Behrang H Hamadani, John Roller, Brian
Dougherty, Howard Yoon
National Institute of Standards and Technology,
Gaithersburg, MD, USA
2:15
(35)
Series Resistance Mapping On
Multijunction Solar Cells Based On
Luminescence Imaging
Helmut Nesswetter
1,2
,
Wilhelm Dyck
1,2
,
Paolo
Lugli
2
,
Andreas W. Bett
3
,
Claus G. Zimmermann
1
1
Solar array center, EADS Astrium, Munich,
Germany,
2
Institute of Nanoelectronics, Technical
University of Munich, Munich, Germany,
3
Fraunhofer Institute for Solar Energy Systems
ISE, Freiburg, Germany
2:30
(36)
Full-Spectrum Optical Beam Induced
Current for Solar Cell Microscopy and Multi-
Junction Characterization
Tasshi Dennis
National Institute of Standards and Technology,
Boulder, CO, USA
2:45
(37)
Improved Grating Monochromator Set-Up
for EQE Measurements of Multi-Junction Solar
Cells
Gerald Siefer, Tobias Gandy, Michael Schachtner,
Alexander Wekkeli, Andreas W. Bett
Fraunhofer ISE, Freiburg, Germany
TECHNICAL PROGRAM