JUNE 16-21, 2013 • TAMPA, FLORIDA
89
Area 8 - Orals
3:30 - 5:00
PM
MR 23
Characterization of Silicon Cells and Material (I)
Chair: Mariana Bertoni, Martin Schubert
3:30
(70)
A Contactless Photoconductance
Technique for the Identification of Impact
Ionization.
D. Westley Miller
1
,
Peter G. Hugger
1
,
K. Jet Meitzner
1
,
Charles W. Warren
1
,
Angus A.
Rockett
2
,
Stephen D. Kevan
1
,
J. David Cohen
1
1
University of Oregon, Eugene, OR, USA,
2
University of Illinois Urbana-Champaign, Urbana,
IL, USA
3:45
(71)
Emitter Sheet Resistance from
Photoluminescence Images
Mattias K Juhl, Yael Augarten, Thorsten Trupke.
University of New South Wales, Sydney, Australia
4:00
Best Student Presentation Award Finalist
(72)
Modelling the Spectral Luminescence
Emission of Silicon Solar Cells and Wafers.
Carsten Schinke, David Hinken, Jan Schmidt,
Karsten Bothe, Rolf Brendel
Institute for Solar Energy Research Hamelin,
Emmerthal, Germany
4:15
(73)
Novel Recombination Lifetime Mapping
Technique through Kelvin Probe Studies.
Nicholas Alderman
1,2
,
Lefteris Danos
1
,
Martin C
Grossel
2
,
Tom Markvart
1
1
Solar Energy Laboratory, University of
Southampton, Southampton, UK,
2
School
of Chemistry, University of Southampton,
Southampton, UK
4:30
(74)
Defect Mapping of Crystalline Silicon
using Spectroscopic Ellipsometry
Sayan Seal
1
,
Vinay Budhraja
1
,
Bhushan Sopori
2
,
Vasundara V. Varadan
1
1
Arkansas GREEN Research Center for Solar
Cells, Department of Electrical Engineering,
University of Arkansas, Fayetteville, AR, USA,
2
National Renewable Energy Laboratory (NREL),
Golden, CO, USA
4:45
(75)
Importance of Defect Photoionization
in Silicon-Rich SiN
x
Dielectrics for High
PID Resistance.
Marshall Wilson
1
,
Alexandre
Savthouck
1
,
John D’Amico
1
,
Jacek Lagowski
1
,
Stefan Schmitt
2
,
Andreas Schneider
2
,
Sara Olibet
2
1
Semilab SDI, Tampa, FL, USA,
2
ISC Konstanz,
Konstanz, Germany
TECHNICAL PROGRAM
