80
40th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
TECHNICAL PROGRAM
(199-I11)
Apparent doping-dependence of the a-Si:H/c-
Si interface degradation upon ITO sputtering.
Igor
P SOBKOWICZ
1,2
, Antoine SALOMON
1
, Pere ROCA i
CABARROCAS
2
.
1
TOTAL New Energies,, Paris La Défense,
France,
2
LPICM CNRS Ecole Polytechnique, Palaiseau, France.
(200-I15)
Some Challenges in Making Accurate and
Reproducible Measurements of Minority Carrier Lifetime
in High-Quality Si Wafers.
Bhushan Sopori
1
, Srinivas
Devayajanam
1,2
, Prakash Basnyat
1,2
, Vishal Mehta
1,2
, Helio
Moutinho
1
, William Nemeth
1
, Vencenzo LaSalvia
1
, Steven
Johnson
1
, NM Ravindra
2
, Jeff Binns
3
, Jesse Appel
4
.
1
National
Renewable Energy Laboratory, Golden, CO, USA,
2
New Jersey
Institute of Technology, Newark, NJ, USA,
3
Sun Edison, StPeters,
MT, USA,
4
Sun Edison, Portland, OR, USA.
Area 8 - Posters
10:30 - 12:00 PM
Exhibit Hall D
Characterization I
Chair(s): Mowafak Al-Jassim, Rebekah Feist, Keith Emery
(201-K29)
Measuring Refractive Index Profiles within Thin-
Film Photovoltaics with High Spatial Resolution using
the Modified IM-IWKB Method.
Yutong T Pang
1,2
, Matthew D
Eisaman
1,2
.
1
Brookhaven National Laboratory, Upton, NY, USA,
2
Department of Physics and Astronomy, Stony Brook University,
Stony Brook, NY, USA.
(202-K32)
InGaAs/GaAs MQWs: Correlation of crystal and
physical properties.
Matthias M. Karow
1
, Nikolai N. Faleev
1
,
David J. Smith
2
, Christiana B. Honsberg
1
.
1
Solar Power
Laboratory, Ira A. Fulton Schools of Engineering, Arizona State
University, Tempe, AZ, USA,
2
Department of Physics, Arizona
State University, Tempe, AZ, USA.
(203-K35)
Investigation on the effects of phosphine doping
in Si nanocrystal material.
Lingfeng Wu, Ivan Perez-Wurfl,
Ziyun Lin, Xuguang Jia, Tian Zhang, Binesh Puthen-Veettil, Terry
Chien-Jen Yang, Hongze Xia, Gavin Conibeer.
University of New
South Wales, Sydney, Australia.
(204-K38)
Selective Passivation of Nitrogen Clusters
and Impurities in GaInNAs Solar Cells.
M Fukuda
1
, V. R.
Whiteside
1
, J. C. Keay
1
, M. B. Johnson
1
, M. Leroux
2
, M. Al
Khalfioui
2
, K. Hossain
3
, T. D. Golding
3
, I. R. Sellers
1
.
1
Department
of Physics, University of Oklahoma, Norman, OK, USA,
2
CRHEA-
CNRS, Valbonne, France,
3
Amethyst Research Inc., Ardmore,
OK, USA.
(205-L1)
Mapping Spectroscopic Ellipsometry of CdTe
Solar Cell Processes: Optimization of Cu Incorporation
for Different CdS/CdTe Thicknesses.
Prakash Koirala
1
,
Xinxuan Tan
1
, Jian Li
1
, Nikolas J Podraza
1
, Sylvain Marsillac
2
,
Angus A Rockett
3
, Robert W Collins
1
.
1
The University of Toledo,
Toledo, OH, USA,
2
Old Dominion University, Norfolk, VA, USA,
3
University of Illinois Urbana-Champaign, Urbana, IL, USA.
(206-L4)
Application of Non-contact Corona-Kelvin
Metrology for Characterization of PV Dielectrics on Textured
Surfaces.
Marshall Wilson
1
, Ziv Hameri
2
, Naomi Nandakumar
2,3
,
Shubham Duttagupta
2,3
.
1
Semilab SDI LLC, Tampa, FL, USA,
2
Solar Energy Research Institute of Singapore, Singapore,
Singapore,
3
Department of Electrical and Computer Engineering,
National University of Singapore, Singapore, Singapore.
