JUNE 16-21, 2013 • TAMPA, FLORIDA
143
K28
(387)
UV-Raman scattering assessment of
ZnO:Al layers from Cu(In,Ga)Se
2
based solar
cells: Application for fast on-line process
monitoring
Cristina Insignares-Cuello
1
,
Victor Izquierdo-
Roca
1
,
Xavier Fontané
1
,
Yudenia Sánchez
1
,
Juan López-García
1
,
Cedric Brousillou
2
,
Edgardo
Saucedo
1
,
Verónica Bermúdez
2
,
Alejandro Pérez-
Rodríguez
1,3
1
IREC, Barcelona, Spain,
2
NEXCIS Photovolt.
Tech., Rousset, France,
3
Universitat de Barcelona,
Barcelona, Spain
K30
(388)
CdTe Films By Elemental Vapor Transport
Vishal Kendre, Vamsi K Evani, Md I Khan, Vasilis
Palekis, Don Morel, Chris Ferekides
University Of South Florida, Tampa, FL, USA
K32
(389)
Effect of Cu Doping on Polycrystalline
CdTe Prepared by Close-Spaced Sublimation
Vishal Kendre, Vamsi K Evani, Md I Khan, Vasilis
Palekis, Don Morel, Chris Ferekides
University Of South Florida, Tampa, FL, USA
K34
(390)
Single Image Concept for
Photoluminescence Based Emitter Saturation
Current Imaging Using Direct Calibration by
the QSS-µPCD Method
Ferenc Korsos
1
,
Andras Zsovar
2
,
Jacek Lagowski
3
,
Marshall Wilson
3
,
Zoltan Kiss
1
,
Zsolt Kovacs
1
,
Gyorgy Nadudvari
1
1
Semilab Co. Ltd., Budapest, Hungary,
2
Budapest
University of Technology and Economics,
Budapest, Hungary,
3
Semilab SDI LLC, Tampa,
FL, USA
K36
(391)
Adhesion Analysis of Evaporated
Aluminum on Passivation Layers for Rear
Metallization of PERC Silicon Solar Cells
Julia Kumm, Dirk Eberlein, Philip Hartmann,
Winfried Wolke, Andreas Wolf, Ralf Preu
Fraunhofer Institute for Solar Energy Systems,
Freiburg, Germany
K38
(392)
Energy rating of photovoltaic modules –
Methodologies and measurements on different
technologies at Enel PV Lab
Antonluca Loteta
1
,
Franco Aleo
1
,
Gianluca
Gigliucci
2
1
Enel Engeneering & Research SPA, Catania,
Italy,
2
Enel Engeneering & Research SPA, Pisa,
Italy
K40
(393)
Junction Depth Estimation using
Wet Chemical Etching for Deep Junction
Fabricated by Laser Doping
Som Mondal, Vishnu K Bajpai, Chetan S Solanki
Indian Institute of Technology Bombay, Mumbai,
India
K42
(394)
Photoconductance rise lifetime study in
crystalline silicon wafers
Bijaya B Paudyal
MKS Instruments Inc, San Jose, CA, USA
TECHNICAL PROGRAM
