144
39
th IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE
K44
(395)
Spectroscopic Ellipsometry
Characterization of Thin Film Photovoltaic
Materials and Devices
Michelle N Sestak
1
,
Li Yan
1
,
Celine Eypert
2
1
HORIBA SCIENTIFIC, Edison, NJ, USA,
2
HORIBA JOBIN-YVON SAS, Longjumeau,
France
L2
(396)
Decoupling surface- and bulk-limited
lifetimes in 50 μm thin silicon using transient
pump-probe spectroscopy
Sin Cheng Siah, Christie B. Simmons, Jasmin
Hofstetter, Mark T. Winkler, Tonio Buonassisi
Massachusetts Institute of Technology,
Cambridge, MA, USA
L4
(397)
Characterization and Dynamic
Impedance of variation in flow rate B
2
H
6
of
a-Si:H PV Modules
Nitikorn Silsirivanich
1,2
,
Dhirayut Chenvidhya
2
,
Krissanapong Kirtikara
1,2
,
Kobsak Sriprapha
3
,
Jaran Sritharathikhun
3
1
Division of Energy Technology, School of Energy,
Environment and Materials,King Mongkut’s
University of Technology Thonburi (KMUTT),126
Pracha-uthit Road, Bang Mod, Thung khru,
Bangkok, Thailand,
2
CES Solar Cell Testing
Center (CSSC),Pilot Plant Development and
Training Institute (PDTI), Bangkok, Thailand,
3
National Electronics and Computer Technology
Center (NECTEC), National Science and
technology Development Agency (NSTDA),
Phathumthani, Thailand
L6
(398)
Impurity analyses of Silicon wafers
from different manufacturing routes and their
impact on LID of finish solar cells
Muhammad Tayyib
1
,
Jan Ove Odden
2
,
Pirmin
Preis
3
,
Tor Oskar Saetre
1
1
University of Agder, Grimstad, Norway,
2
Elkem
Solar AS, Kristiansand, Norway,
3
ISC Konstanz,
Konstanz, Germany
L8
(399)
Microscopic Defects and Impurity
Analyses of Multicrystalline Silicon Solar Cells
from different manufacturing routes
Muhammad Tayyib
1
,
Espen Dahl
2,3
,
Jan Ove
Odden
2
,
Tor Oskar Saetre
1
1
University of Agder, Grimstad, Norway,
2
Elkem
Solar AS, Kristiansand, Norway,
3
Aarhus
University, Aarhus, Denmark
L10
(400)
Estimation of Random Pyramid Texturing
Density via Capacitance-Voltage Measurement
in c-Si Solar Cells
Xufeng Wang, Muhammad Alam
Purdue University, West lafayette, IN, USA
L11
(401)
Theoretical study of (112) GBs and
stacking faults in polycrystalline CuInSe
2
thin
films
Bo Yin, Chaogang Lou
Southeast University, Nanjing, China
TECHNICAL PROGRAM
